Title

Complex Permittivity Extraction from PCB Stripline Measurement using Recessed Probe Launch

Abstract

A method to extract the complex permittivity of a dielectric material in a PCB is presented. The recessed probe launch allows striplines to be measured without the need of via transitions that are subject to large process variations. After pad parasitics are de-embedded using the two-line method, the complex permittivity of the dielectric is calculated from 20MHz to 5 GHz using closed-form equations. Internal inductance is taken into account to prevent overestimation of the permittivity at low frequency.

Department(s)

Electrical and Computer Engineering

Keywords and Phrases

Complex Permittivity; Dielectric Constant; Loss Tangent; Printed Circuit Board; Recessed Probe Launch; Stripline

International Standard Serial Number (ISSN)

13492543

Document Type

Article - Journal

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2015 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

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