Complex Permittivity Extraction from PCB Stripline Measurement using Recessed Probe Launch
A method to extract the complex permittivity of a dielectric material in a PCB is presented. The recessed probe launch allows striplines to be measured without the need of via transitions that are subject to large process variations. After pad parasitics are de-embedded using the two-line method, the complex permittivity of the dielectric is calculated from 20MHz to 5 GHz using closed-form equations. Internal inductance is taken into account to prevent overestimation of the permittivity at low frequency.
C. Hwang et al., "Complex Permittivity Extraction from PCB Stripline Measurement using Recessed Probe Launch," IEICE Electronics Express, vol. 12, no. 5, Institute of Electrical and Electronics Engineers (IEEE), Feb 2015.
The definitive version is available at http://dx.doi.org/10.1587/elex.12.20150023
Electrical and Computer Engineering
Keywords and Phrases
Complex Permittivity; Dielectric Constant; Loss Tangent; Printed Circuit Board; Recessed Probe Launch; Stripline
International Standard Serial Number (ISSN)
Article - Journal
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