Title

Analytic Calculation of Jitter Induced by Power and Ground Noise Based on IBIS I/V Curve

Abstract

Supply fluctuation is one of the most significant factors that cause jitter in high-speed I/O links. The traditional SPICE simulation or measuring method for power supply induced jitter is quite time-consuming and draining on resources. The I/O buffer information specification (IBIS) model is a popular standard for electronic behavioral specifications of digital integrated circuit I/O characteristics. Analytic jitter transfer functions for supply fluctuations are derived by solving two-order differential equations based on IBIS current versus voltage characteristics and pin package parameters. Then, the total time interval error induced by power and ground noise is obtained in both frequency domain and time domain. The method is validated by comparing the analytic calculation results with HSPICE simulated results for a DDR4 output buffer.

Department(s)

Electrical and Computer Engineering

Research Center/Lab(s)

Electromagnetic Compatibility (EMC) Laboratory

Comments

This work was supported by the National Natural Science Foundation of China under Grant 61501345.

Keywords and Phrases

I/O Buffer Information Specification (IBIS); Jitter; Jitter Transfer Function; Supply Fluctuation

International Standard Serial Number (ISSN)

0018-9375

Document Type

Article - Journal

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2018 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

Share

 
COinS