Interferometric Study on the Adsorption-dependent Refractive Index of Silicalite Thin Films Grown on Optical Fibers
Recommended Citation
J. Zhang et al., "Interferometric Study on the Adsorption-dependent Refractive Index of Silicalite Thin Films Grown on Optical Fibers," Chemistry of Materials, American Chemical Society (ACS), Jan 2006.
The definitive version is available at https://doi.org/10.1021/cm0525353
Department(s)
Electrical and Computer Engineering
Sponsor(s)
United States. Department of Energy
Keywords and Phrases
Raman Spectra; Zeolite Films; Raman effect; Refractive index
International Standard Serial Number (ISSN)
0897-4756
Document Type
Article - Journal
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2006 American Chemical Society (ACS), All rights reserved.
Publication Date
01 Jan 2006
