Finite Flange Correction for Microwave and Millimeter-Wave Nondestructive Material Characterization

Abstract

Open-ended waveguide material characterization is an effective nondestructive testing (NDT) technique for evaluating the dielectric constant and thickness of individual layers in a multilayered composite structure. A limitation of this technique is that the finite flange contributes to the estimation error, depending on the thickness and dielectric loss factor of the layers. Its effects are non-negligible in particular when measuring the dielectric constant of low-loss and thin materials. This paper studies the effect of using a common finite-flanged open-ended waveguide on the error in estimating the permittivity and loss-tangent of a dielectric sheet. This paper also presents a proposed modification to the flange geometry in order to markedly reduce this undesired effect.

Meeting Name

IEEE International Instrumentation and Measurement Technology Conference: Instrumentation and Measurement for Life (2013: May 6-9, Minneapolis, MN)

Department(s)

Electrical and Computer Engineering

Keywords and Phrases

Complex Permittivity; Finite Flange; Open-Ended Waveguide; Thin Sheets; Dielectric Loss Factors; Dielectric Sheets; Estimation Errors; Material Characterizations; Multilayered Composite Structures; Flanges; Instruments; Measurements; Nondestructive Examination

International Standard Book Number (ISBN)

978-1467346221

International Standard Serial Number (ISSN)

1091-5281

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2013 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

Publication Date

01 May 2013

Link to Full Text

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