Title

A New Dual-Loaded Aperture Probe for Near-Field Millimeter Wave Imaging

Abstract

Millimeter wave differential probes have demonstrated great potential for high-resolution near-field imaging and detection of small and low scattering targets. There are several differential probe designs that already exist each with own advantages and disadvantages. An alternative design, using switchable loaded elliptical slot antennas placed on a standard waveguide aperture is proposed. The proposed probe provides higher image resolution in a much smaller form factor (i.e., overall size). This design is compared to prior designs of differential probes through simulation and measurements.

Meeting Name

IEEE International Instrumentation and Measurement Technology Conference (2017: May 22-25, Politecnico di TorinoTorino, Italy)

Department(s)

Electrical and Computer Engineering

Keywords and Phrases

Differential Probe; Loaded Aperture; Millimeter Wave; Near-Field; Nondestructive Testing

International Standard Book Number (ISBN)

9781509035960

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2017 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

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