Phase-Resolved Near-Field Scan Over Random Fields

Author

Tianqi Li
Victor Khilkevich, Missouri University of Science and TechnologyFollow
David Pommerenke, Missouri University of Science and TechnologyFollow

Abstract

This letter discusses an averaging technique for phase-resolved scanning of the fields generated by multiple uncorrelated stochastic sources. This method can separate the field contribution of each noise source into the resulting field patterns as if the sources that are not of interest were turned off. The scanned data can be used to localize the emission sources and to calculate the far-field pattern and total radiated power.

Recommended Citation

T. Li et al., "Phase-Resolved Near-Field Scan Over Random Fields," IEEE Transactions on Electromagnetic Compatibility, vol. 58, no. 2, pp. 506 - 511, Institute of Electrical and Electronics Engineers (IEEE), Apr 2016.

The definitive version is available at https://doi.org/10.1109/TEMC.2016.2517651

Department(s)

Electrical and Computer Engineering

Research Center/Lab(s)

Electromagnetic Compatibility (EMC) Laboratory

Keywords and Phrases

Condensed matter physics; Electromagnetic compatibility; Averaging technique; Emission sources; Far-field patterns; Field patterns; Near-field scan; Phase-resolved; Random fields; Total radiated power; Stochastic systems; emission source microscopy

International Standard Serial Number (ISSN)

0018-9375

Document Type

Article - Journal

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2016 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

Publication Date

01 Apr 2016