Title

Phase-Resolved Near-Field Scan Over Random Fields

Abstract

This letter discusses an averaging technique for phase-resolved scanning of the fields generated by multiple uncorrelated stochastic sources. This method can separate the field contribution of each noise source into the resulting field patterns as if the sources that are not of interest were turned off. The scanned data can be used to localize the emission sources and to calculate the far-field pattern and total radiated power.

Department(s)

Electrical and Computer Engineering

Keywords and Phrases

Condensed matter physics; Electromagnetic compatibility; Averaging technique; Emission sources; Far-field patterns; Field patterns; Near-field scan; Phase-resolved; Random fields; Total radiated power; Stochastic systems; emission source microscopy

International Standard Serial Number (ISSN)

0018-9375

Document Type

Article - Journal

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2016 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.


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