A Passive Coupling Circuit for Injecting TLP-Like Stress Pulses into Only One End of a Driver/Receiver System
Abstract
In this paper, a simple passive circuit is presented which allows TLP stress and characterization pulses to be injected into only one side of a driver/receiver system. The circuit is simulated and tested, demonstrating the possibility for directional current injection on the order of 60:1. The circuit also provides a method for measuring both injected currents when paired with a typical TLP system.
Recommended Citation
B. Orr et al., "A Passive Coupling Circuit for Injecting TLP-Like Stress Pulses into Only One End of a Driver/Receiver System," Proceedings of the 37th Electrical Overstress/Electrostatic Discharge Symposium (2015, Reno, NV), vol. 2015-October, ESD Association, Oct 2015.
Meeting Name
37th Electrical Overstress/Electrostatic Discharge Symposium (2015: Sep. 27-Oct. 2, Reno, NV)
Department(s)
Electrical and Computer Engineering
Research Center/Lab(s)
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
Reconfigurable hardware; Current injections; Injected current; Passive coupling; Stress pulse; TLP stress; Passive networks
International Standard Book Number (ISBN)
978-158537273-7
International Standard Serial Number (ISSN)
0739-5159
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2015 ESD Association, All rights reserved.
Publication Date
01 Oct 2015
