Title

Super Resolution Emission Source Microscopy using Water Immersion

Abstract

A two-dimensional emission source microscopy (ESM) algorithm based on the synthetic aperture radar (SAR) technique is used for EMI source localization. The resolution of the ESM method is proportional to the wavelength of electromagnetic radiation, and at the frequency of 1 GHz, the theoretical resolution limit in air is 15 cm which is too coarse for many practical applications. The resolution can be improved if water is used as the medium between the device under test (DUT) and the receiving probe, leading to a much shorter wavelength. It is demonstrated that by using water immersion it is possible to achieve resolution of 2.5 cm at 1 GHz, which is a 6-fold improvement over a measurement in air.

Meeting Name

2016 IEEE International Symposium on Electromagnetic Compatibility (2016: Jul. 25-29, Ottawa, Canada)

Department(s)

Electrical and Computer Engineering

Keywords and Phrases

Design for testability; Electromagnetic waves; Optical resolving power; Synthetic aperture radar; Device under test; Emission sources; manual scan; Microwave imaging; Resolution limits; Shorter wavelength; Source localization; Super resolution; Electromagnetic compatibility; EMI; Emission Source Microscopy

International Standard Book Number (ISBN)

978-150901441-5

International Standard Serial Number (ISSN)

1077-4076

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2016 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

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