Prediction of Electrostatic Discharge (ESD) Soft Error on Two-Way Radio using ESD Simulation in CST and ESD Immunity Scanning Technique
Electrostatic Discharge (ESD) can cause ESD soft error failures such as radio reset. In this paper, a new methodology is developed to assess ESD risk at system level prior to PCB fabrication using 3D simulation. A Poynting vector theorem is used to calculate the accumulated incident power received by the sensitive IC which is identified through ESD immunity scanning test. The time-weighted-Average peak power is to establish the criteria for ESD risk causing the soft error failure. Results from this paper will help electrical engineer to predict potential ESD reset failure at system level instead of the previously trial-And-error procedure.
R. Antong et al., "Prediction of Electrostatic Discharge (ESD) Soft Error on Two-Way Radio using ESD Simulation in CST and ESD Immunity Scanning Technique," Proceedings of the 36th IEEE International Electronics Manufacturing Technology Conference (2014, Malaysia), vol. 2015-June, Institute of Electrical and Electronics Engineers (IEEE), Jun 2015.
The definitive version is available at http://dx.doi.org/10.1109/IEMT.2014.7123098
36th IEEE International Electronics Manufacturing Technology Conference (2014: Nov. 11-13, Johor, Malaysia)
Electrical and Computer Engineering
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
Electromagnetic waves; Electrostatic discharge; Electrostatics; Errors; Industrial electronics; Manufacture; Outages; Printed circuit boards; Radiation hardening; Risk assessment; 3D simulations; Incident power; PCB fabrication; Poynting vectors; Scanning techniques; Time-weighted averages; Trial-and-error procedures; Two-way radio; Electrostatic devices
International Standard Book Number (ISBN)
International Standard Serial Number (ISSN)
Article - Conference proceedings
© 2015 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.