The Impact of Near-Field Scanning Size on the Accuracy of Far-Field Estimation

Abstract

The impact of near-field scanning sizes on the accuracy of far-field estimations is studied using a U-shape trace above a large ground plane as an example. Simulation model is built in commercial software and the planar near fields above the trace are obtained. Fourier Transform of the planar near fields is used to calculate the far-field radiations. Different sizes of planar scanning area are chosen and their corresponding computed far field patterns and maximum values are compared with those obtained by the software. It demonstrates that too small scanning size may lead to large errors in far-field calculations. Relationship between scanning plane height and planar scanning size is derived for accurate far field estimation, which is guidance for the extraction of accurate IC radiated emission model by planar near-field scanning technique.

Meeting Name

2014 IEEE International Symposium on Electromagnetic Compatibility (2014: Aug. 4-8, Raleigh, NC)

Department(s)

Electrical and Computer Engineering

Research Center/Lab(s)

Center for High Performance Computing Research

Second Research Center/Lab

Electromagnetic Compatibility (EMC) Laboratory

Keywords and Phrases

Near-Field/Far-Field Transformation; IC Radiated Emission; Fourier Transform; Near-Field Scanning Technique

International Standard Serial Number (ISSN)

2158-1118

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2014 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

Publication Date

01 Aug 2014

Link to Full Text

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