Fast Method for EIS Sweep Test

Abstract

This paper proposed a novel fast band-sweep measurement method for efficient isotropic sensitivity (EIS) of wireless devices. The method is built on the facts that the relationship between the bit error rate (BER) and the received power is generally consistent in the same band, and the EIS values at a fixed angle is slowly-changing on the frequency except harmonics. Therefore, only few frequency points are required to be measured for a whole band sweep test resulting in a significantly decrease in measurement time.

Meeting Name

7th Asia-Pacific International Symposium on Electromagnetic Compatibility (2016: May 17-21, Shenzhen, China)

Department(s)

Electrical and Computer Engineering

Research Center/Lab(s)

Center for High Performance Computing Research

Second Research Center/Lab

Electromagnetic Compatibility (EMC) Laboratory

Keywords and Phrases

Electromagnetic compatibility; efficient isotropic sensitivity; Fast methods; harmonics; Measurement time; Received power; Sweep measurements; Sweep tests; Wireless devices; Bit error rate; band-sweep test

International Standard Book Number (ISBN)

978-146739494-9

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2016 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

Publication Date

01 May 2016

Link to Full Text

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