Title

De-Embedding Techniques for Transmission Lines: An Application to Measurements of On-Chip Coplanar Traces

Abstract

In this paper, the de-embedding study presented in [1] is extended from the simulation environment to the measurement environment; the three presented de-embedding methods are applied to measurements of on-chip coplanar traces for two different test ICs. Additionally, the Hybrid technique presented in [1] is reformulated so that only two measurement standards are required, as opposed to three. The results of de-embedding the measurement data are discussed, as well as challenges with making the measurements.

Meeting Name

2014 IEEE International Symposium on Electromagnetic Compatibility (2014: Aug. 4-8, Raleigh, NC)

Department(s)

Electrical and Computer Engineering

Research Center/Lab(s)

Center for High Performance Computing Research

Keywords and Phrases

De-embedding; De-embedding method; De-embedding techniques; Hybrid techniques; Measurement data; Measurement standards; Measurements of; Simulation environment; Electromagnetic compatibility

International Standard Serial Number (ISSN)

10774076

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2014 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.


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