De-Embedding Method to Accurately Measure High-Frequency Impedance of an O-Shape Spring Contact
In this paper, a de-embedding method is proposed to measure the impedance of an innovative O-shape spring contact, for frequency up to 30 GHz. To allow the de-embedding method to be applied in practical situations, both conductor loss and the discontinuity associated with the junction are taken into account. Results obtained from the de-embedding method are validated using full wave simulation. In the simulation model, the O-shape spring contact is cut into two pieces based on the current flow paths, providing a straightforward way to understand why a resonance exists in the impedance profile of the connector. Lastly, the advantages and drawbacks of this method are discussed.
Q. Huang et al., "De-Embedding Method to Accurately Measure High-Frequency Impedance of an O-Shape Spring Contact," IEEE International Symposium on Electromagnetic Compatibility, pp. 600-603, Institute of Electrical and Electronics Engineers (IEEE), Aug 2014.
The definitive version is available at https://doi.org/10.1109/ISEMC.2014.6899041
2014 IEEE International Symposium on Electromagnetic Compatibility (2014: Aug. 4-8, Raleigh, NC)
Electrical and Computer Engineering
Center for High Performance Computing Research
Second Research Center/Lab
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
Electric impedance; Conductor loss; Current flows; De-embedding method; Full-wave simulations; High frequency HF; High frequency impedance; Impedance profiles; Simulation model; Electromagnetic compatibility; O-Clip
International Standard Serial Number (ISSN)
Article - Conference proceedings
© 2014 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.