Title

Analytical and Numerical Sensitivity Analyses of Fixtures De-Embedding

Abstract

De-embedding procedures are sensitive to manufacturing variations in test fixtures, as well as inaccuracies associated with the calibration and measurement process. Such sensitivities can propagate through de-embedding procedures, resulting in amplified errors. In this paper, analytical and numerical techniques are used to perform sensitivity studies on both simulation and measurement data, with respect to de-embedding.

Meeting Name

2016 IEEE International Symposium on Electromagnetic Compatibility (2016: Jul. 25-29, Ottawa, Canada)

Department(s)

Electrical and Computer Engineering

Research Center/Lab(s)

Center for High Performance Computing Research

Keywords and Phrases

Electromagnetic compatibility; Fixtures (tooling); Numerical methods; Analytical sensitivity analysis; De-embedding; Error propagation; Numerical sensitivity; Sensitivity methods; Sensitivity analysis

International Standard Book Number (ISBN)

978-1-5090-1441-5

International Standard Serial Number (ISSN)

10774076

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2016 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.


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