Analytical and Numerical Sensitivity Analyses of Fixtures De-Embedding
Abstract
De-embedding procedures are sensitive to manufacturing variations in test fixtures, as well as inaccuracies associated with the calibration and measurement process. Such sensitivities can propagate through de-embedding procedures, resulting in amplified errors. In this paper, analytical and numerical techniques are used to perform sensitivity studies on both simulation and measurement data, with respect to de-embedding.
Recommended Citation
B. Chen et al., "Analytical and Numerical Sensitivity Analyses of Fixtures De-Embedding," IEEE International Symposium on Electromagnetic Compatibility (2015, Dresden, Germany), pp. 440 - 444, Institute of Electrical and Electronics Engineers (IEEE), Jul 2016.
The definitive version is available at https://doi.org/10.1109/ISEMC.2016.7571688
Meeting Name
2016 IEEE International Symposium on Electromagnetic Compatibility (2016: Jul. 25-29, Ottawa, Canada)
Department(s)
Electrical and Computer Engineering
Research Center/Lab(s)
Center for High Performance Computing Research
Keywords and Phrases
Electromagnetic compatibility; Fixtures (tooling); Numerical methods; Analytical sensitivity analysis; De-embedding; Error propagation; Numerical sensitivity; Sensitivity methods; Sensitivity analysis
International Standard Book Number (ISBN)
978-1-5090-1441-5
International Standard Serial Number (ISSN)
1077-4076
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2016 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Jul 2016
