Near-field scanning has often been used to measure and characterize magnetic fields surrounding individual integrated circuits (IC) and high speed digital electronic circuits. The paper describes the use of near-field scanning data, performed in a typical laboratory bench top environment, to predict radiated electromagnetic interference (EMI) in a typical product environment. The product environment may include enclosures and apertures. The approach begins by acquiring sufficient near-field scanning data to allow representation of an unintentional radiating source by an equivalent surface current distribution. The equivalent current distribution is used as a source in numerical full wave modeling. The agreement between direct full wave simulation results and full wave simulation results using equivalent sources works well under certain assumptions.

Meeting Name

InternationalSymposium on Electromagnetic Compatibility, 2004


Electrical and Computer Engineering

Keywords and Phrases

EMI; FDTD; Apertures; Current Distribution; Electromagnetic Interference; Enclosures; Equivalent Current Distribution; Finite Difference Time-Domain Analysis; High Speed Digital Electronic Circuits; Integrated Circuits; Magnetic Field Measurement; Near-Field Scanning; Radiated Field Prediction

Document Type

Article - Conference proceedings

Document Version

Final Version

File Type





© 2004 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

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