Abstract

Decoupling capacitor location in DC power bus design is a critical design choice for which proven guidelines are not well established. The mutual inductance between two closely spaced vias can have a great impact on the coupling between an IC and a decoupling capacitor. This coupling is a function of the spacing between the IC and capacitor, and spacing between power and ground layers. The impact of the mutual inductance on decoupling, i.e., local versus global decoupling, was studied, using a circuit extraction approach based on a mixed-potential integral equation. Modeling indicates that local decoupling has benefits over global decoupling for certain ranges of IC/capacitor spacing and power layer thickness. Design curves for evaluating local decoupling benefits were generated, which can be used to guide surface mount technology (SMT) decoupling capacitor placement.

Meeting Name

IEEE International Symposium on Electromagnetic Compatibility (2000: Aug. 21-25, Washington, DC)

Department(s)

Electrical and Computer Engineering

Research Center/Lab(s)

Electromagnetic Compatibility (EMC) Laboratory

Keywords and Phrases

Printed Circuit Layout; Printed Circuit Testing; Coupled Circuits; DC Machinery; Inductance Measurement; Integral Equations; Integrated Circuits; Location; Surface Mount Technology; Decoupling Capacitors Location; Mutual Inductance; Capacitors; Inductance; Electromagnetic Induction

International Standard Book Number (ISBN)

780356772

International Standard Serial Number (ISSN)

0190-1494

Document Type

Article - Conference proceedings

Document Version

Final Version

File Type

text

Language(s)

English

Rights

© 2000 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

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