In this study, mutual capacitance and inductance between two coupled traces is measured and computed to validate and simplify coupling algorithms used in an expert system software package. The algorithm's applicability to common microstrip configurations is tested through comparisons between FEM based solutions, |S21| measurements and the algorithm solutions under several permutations of a test board. Adjustments to the original algorithm are proposed that reduce computation times with out significantly affecting the accuracy of the result.
T. M. Zeeff et al., "Microstrip Coupling Algorithm Validation and Modification Based on Measurements and Numerical Modeling," Proceedings of the IEEE International Symposium on Electromagnetic Compatibility (1999, Seattle, WA), vol. 1, pp. 323-327, Institute of Electrical and Electronics Engineers (IEEE), Aug 1999.
The definitive version is available at http://dx.doi.org/10.1109/ISEMC.1999.812921
IEEE International Symposium on Electromagnetic Compatibility (1999: Aug. 2-6, Seattle, WA)
Electrical and Computer Engineering
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
FEM Based Solutions; S21 Measurements; Capacitance; Computation Times; Coupled Traces; Electrical Engineering Computing; Electromagnetic Coupling; Electromagnetic Interference; Expert System Software Package; Expert Systems; Inductance; Mesh Generation; Microstrip Configurations; Microstrip Coupling Algorithm; Microstrip Lines; Modification; Mutual Capacitance; Software Packages; Test Board; Validation; Waveguide Theory
International Standard Book Number (ISBN)
International Standard Serial Number (ISSN)
Article - Conference proceedings
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