The growing reliance on commercial-off-the-shelf (COTS) components for developing large-scale projects introduces a new paradigm in software Engineering; which requires the design of new software development and business processes. Large scale component reuse leads to savings in development resources, enabling these resources to be applied to areas such as quality improvement. These savings come at the price of integration difficulties, performance constraints, and incompatibility of components from multiple vendors. Relying on COTS components also increases the system''s vulnerability to risks arising from third-party development, which can negatively affect the quality of the system, as well as causing expenses not incurred in traditional software development. We aim to alleviate such concerns by using software metrics to accurately quantify factors contributing to the overall quality of a component-based system, guiding quality and risk management by identifying and eliminating sources of risk
S. Sedigh et al., "Metrics-Guided Quality Management for Component-Based Software Systems," Proceedings of the 25th Annual International Computer Software and Applications Conference (2001, Chicago, IL), pp. 303-308, Institute of Electrical and Electronics Engineers (IEEE), Oct 2001.
The definitive version is available at http://dx.doi.org/10.1109/CMPSAC.2001.960631
25th Annual International Computer Software and Applications Conference (2001: Oct. 8-12, Chicago, IL)
Electrical and Computer Engineering
Keywords and Phrases
Business Processes; Commercial-Off-The-Shelf Components; Component Reuse; Component-Based Software Systems; Development Resources; Incompatibility; Integration Difficulties; Large-Scale Projects; Metrics-Guided Quality Management; Performance Constraints; Quality Improvement; Quality Management; Risk Management; Software Engineering; Software Metrics; Software Quality; Software Reusability; Third-Party Development
International Standard Book Number (ISBN)
International Standard Serial Number (ISSN)
Article - Conference proceedings
© 2001 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.