Developing a Universal Exchange Format for Near-Field Scan Data

Meeting Name

IEEE International Symposium on Electromagnetic Compatibility, EMC 2009 (2009: Aug. 17-21, Austin, TX)

Department(s)

Electrical and Computer Engineering

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2009 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

Publication Date

21 Aug 2009

This document is currently not available here.

Share

 
COinS