Abstract
We present nondestructive measurements of material properties using TEM horn antennas and an ultra-wideband measurement system. Time-domain gating and genetic algorithms are used to process the data and extract the dielectric properties of the material under test.
Recommended Citation
C. A. Grosvenor and R. Johnk and D. Novotny and S. Canales and J. Baker-Jarvis and M. Janezic and J. L. Drewniak and M. Koledintseva and J. Zhang and P. C. Ravva, "Electrical Material Property Measurements using a Free-Field, Ultra-Wideband System [Dielectric Measurements]," Proceedings of the Conference on Electrical Insulation and Dielectric Phenomena (2004, Boulder, CO), pp. 174 - 177, Institute of Electrical and Electronics Engineers (IEEE), Oct 2004.
The definitive version is available at https://doi.org/10.1109/CEIDP.2004.1364217
Meeting Name
Conference on Electrical Insulation and Dielectric Phenomena (2004: Oct. 17-20, Boulder, CO)
Department(s)
Electrical and Computer Engineering
Research Center/Lab(s)
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
300 KHz to 4000 MHz; TEM Horn Antennas; Dielectric Measurement; Dielectric Properties Measurements; Electrical Material Property Measurements; Free-Field Ultra-Wideband System; Genetic Algorithms; Horn Antennas; Microwave Measurement; Network Analysers; Nondestructive Measurement; Short-Impulse-Response Antennas; Time-Domain Gating; Vector Network Analyzer; Electrical Materials; Material Parameters; Material Properties; Ultra-Wideband Systems; Dielectric Properties; Measurements; Nondestructive Examination; Time Domain Analysis; Transmission Electron Microscopy; Broadband Networks
International Standard Book Number (ISBN)
780385845
International Standard Serial Number (ISSN)
0084-9162
Document Type
Article - Conference proceedings
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 2004 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Oct 2004
