Abstract

We present nondestructive measurements of material properties using TEM horn antennas and an ultra-wideband measurement system. Time-domain gating and genetic algorithms are used to process the data and extract the dielectric properties of the material under test.

Meeting Name

Conference on Electrical Insulation and Dielectric Phenomena, 2004. CEIDP '04

Department(s)

Electrical and Computer Engineering

Keywords and Phrases

300 KHz to 4000 MHz; TEM Horn Antennas; Dielectric Measurement; Dielectric Properties Measurements; Electrical Material Property Measurements; Free-Field Ultra-Wideband System; Genetic Algorithms; Horn Antennas; Microwave Measurement; Network Analysers; Nondestructive Measurement; Short-Impulse-Response Antennas; Time-Domain Gating; Vector Network Analyzer

Document Type

Article - Conference proceedings

Document Version

Final Version

File Type

text

Language(s)

English

Rights

© 2004 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

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