Conventional automatic test pattern generation (ATPG) algorithms fail when applied to asynchronous NULL convention logic (NCL) circuits due to the absence of a global clock and presence of more state-holding elements, leading to poor fault coverage. This paper presents a design-for-test (DFT) approach aimed at making asynchronous NCL designs testable using conventional ATPG programs. We propose an automatic DFT insertion flow (ADIF) methodology that performs scan and test point insertion on NCL designs to improve test coverage, using a custom ATPG library. Experimental results show significant increase in fault coverage for NCL cyclic and acyclic pipelined designs.
V. Satagopan et al., "DFT Techniques and Automation for Asynchronous NULL Conventional Logic Circuits," IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Institute of Electrical and Electronics Engineers (IEEE), Oct 2007.
The definitive version is available at http://dx.doi.org/10.1109/TVLSI.2007.903945
Electrical and Computer Engineering
Keywords and Phrases
Asynchronous Circuits; Automatic Test Pattern Generation; Design for Testability; Logic Design; Logic Testing
Article - Conference proceedings
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