Abstract

The recent development of nanoscale materials and assembly techniques has resulting in the manufacturing of high-density computational systems. These systems consist of nanometer-scale elements and are likely to have many manufacturing imperfections (defects); thus, defect-tolerance is considered as one of the most some algorithms for repairing defective crosspoints in a nanoscale crossbar architecture; furthermore we estimate the efficiency and cost-effectiveness of each algorithm. Also, for a given design and manufacturing environment, we propose a cost-driven method to find a balanced solution by which figures of merit such as area, repair time and reconfiguration cost can be taken into account. Probabilistic parameters are utilized in the proposed cost-driven method for added flexibility.

Meeting Name

6th IEEE Conference on Nanotechnology: IEEE-NANO (2006: Jul. 17-20, Cincinnati, OH)

Department(s)

Electrical and Computer Engineering

Keywords and Phrases

Cost-Driven Repair; Crosspoints; Nanoscale Materials; Cost Effectiveness; Defects; Numerical Methods; Parameter Estimation; Probability; Repair; Nanowires

International Standard Book Number (ISBN)

1424400775

International Standard Serial Number (ISSN)

1944-9399

Document Type

Article - Conference proceedings

Document Version

Final Version

File Type

text

Language(s)

English

Rights

© 2006 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

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