Abstract

A procedure for the calibration and compensation of near-field scanning is described and demonstrated. Ultimately, the objective is to quantify the individual field components associated with electromagnetic interference (EMI) from high speed circuitry and devices. Specific examples of these methods are shown. The effects of compensation are small but noticeable when the uncompensated output signal from near field scanning is already a very good representation of the field being measured. In other cases, the improvement provided by compensation can be significant when the uncompensated output signal bears little resemblance to the underlying field.

Department(s)

Electrical and Computer Engineering

Keywords and Phrases

Calibration; EMI; Compensation; Electric Field Measurement; Electromagnetic Interference; Field Components; Near-Field Probes; Near-Field Scan Measurements; Near-Field Scanning

International Standard Serial Number (ISSN)

0018-9375

Document Type

Article - Journal

Document Version

Final Version

File Type

text

Language(s)

English

Rights

© 2005 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

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