Abstract

Immunity scanning methods can be used to locate sensitive areas on PCBs and ICs. For the analysis of emissions near field scanning is used to determine the local field strength. Both methods have many similarities and differences. For both methods it is difficult to correlate between board level scanning and system level test results as neither method shows the coupling path directly. The paper shows the implementation of an immunity scanning system and analyzes the advantages and limitations of immunity near field scanning.

Meeting Name

18th International Zurich Symposium on Electromagnetic Compatibility, 2007. EMC Zurich 2007

Department(s)

Electrical and Computer Engineering

Keywords and Phrases

Immunity Scanning System

Library of Congress Subject Headings

Integrated circuits
Printed circuits

Document Type

Article - Conference proceedings

Document Version

Final Version

File Type

text

Language(s)

English

Rights

© 2007 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

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