Abstract
Numerical simulations were used to investigate the disturbance introduced by placing a small magnetic loop probe in the near field of a driven loop. In the absence of the loop probe, the numerical simulations were compared with an approximate closed-form analytical expression for the magnetic field produced by the driven loop. The agreement between the approximate analytical results and the simulation was good. The next set of simulations was based on a physical model that included the probe and showed that the probe does exert an effect on the field being measured. Examples of these simulations and their implications on measurements will be discussed.
Recommended Citation
J. Shi et al., "A Study of the Probe Induced Disturbances on the Near-Field Measurement," Proceedings of the IEEE International Symposium on Electromagnetic Compatibility, 2003, Institute of Electrical and Electronics Engineers (IEEE), Jan 2003.
The definitive version is available at https://doi.org/10.1109/ICSMC2.2003.1428211
Meeting Name
IEEE International Symposium on Electromagnetic Compatibility, 2003
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
FDTD; TLM; Closed-Form Analytical Expression; Electromagnetic Compatibility; Electromagnetic Wave Propagation; Magnetic Field Measurement; Magnetic Field Production; Magnetic Loop Probe; Near Field Scan; Near-Field Measurement; Numerical Simulations; Physical Model; Probe Induced Disturbances
Document Type
Article - Conference proceedings
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 2003 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Jan 2003
