Fuzzy attributed graph (FAG) is not only widely used in the fields of image understanding and pattern recognition, but is useful to fuzzy graph matching problem. One of the applications of fuzzy graph matching is the subcircuit extraction problem. Subcircuit extraction problem is very important for VLSI testing, layout versus schematic (LVS) check, and circuit partition, etc. In this paper, fuzzy attributed graph (FAG) is first effectively applied to the subgraph isomorphism problem. And then we provide an efficient fuzzy attributed graph algorithm based on the solution to subgraph isomorphism for the subcircuit extraction problem. Similarity measurement makes a significant contribution to both the subgraph isomorphism problem and the subcircuit extraction problem.
N. Zhang and D. C. Wunsch, "A Fuzzy Attributed Graph Approach to Subcircuit Extraction Problem," Proceedings of the 12th IEEE International Conference on Fuzzy Systems, 2003. FUZZ '03, Institute of Electrical and Electronics Engineers (IEEE), Jan 2003.
The definitive version is available at http://dx.doi.org/10.1109/FUZZ.2003.1206579
12th IEEE International Conference on Fuzzy Systems, 2003. FUZZ '03
Electrical and Computer Engineering
Keywords and Phrases
VLSI; VLSI Testing; Circuit Layout CAD; Circuit Partition; Circuit Simulation; Efficient Fuzzy Attributed Graph Algorithm; Fuzzy Graph Matching Problem; Fuzzy Set Theory; Graph Theory; Image Understanding; Isomorphism; Layout Versus Schematic Check; Pattern Recognition; Subcircuit Extraction Problem; Subgraph Isomorphism
Article - Conference proceedings
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