Abstract

Susceptibility scanning is an increasingly adopted method for root cause analysis of system-level immunity sensitivities. It allows localizing affected nets and integrated circuits (ICs). Further, it can be used to compare the immunity of functionally identical or similar ICs or circuit boards. This paper explains the methodology as applied to electrostatic discharge and provides examples of scan maps and signals probed during immunity scanning. Limitations of present immunity analysis methods are discussed.

Department(s)

Electrical and Computer Engineering

Second Department

Materials Science and Engineering

Keywords and Phrases

Electrostatic Discharges (ESDs); Scanning; Susceptibility

Library of Congress Subject Headings

Immunity

Document Type

Article - Journal

Document Version

Final Version

File Type

text

Language(s)

English

Rights

© 2008 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

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