Near-field probes are often used to measure the electric and magnetic fields above a printed circuit board in order to identify the sources and coupling paths of an electromagnetic interference (EMI) problem. It is the objective of this paper to propose a rapid E-, Hx- Hy- and circular H-fields measurement using an orthogonal loops probe design. The effects of this probe are analyzed using full-wave simulations and measurements.
T. Li et al., "Orthogonal Loops Probe Design and Characterization for Near-Field Measurement," Proceedings of the 2005 International Symposium on Electromagnetic Compatibility, 2008. EMC 2008, Institute of Electrical and Electronics Engineers (IEEE), Aug 2008.
The definitive version is available at http://dx.doi.org/10.1109/ISEMC.2008.4652138
2005 International Symposium on Electromagnetic Compatibility, 2008. EMC 2008
Electrical and Computer Engineering
Keywords and Phrases
Electromagnetic Interference; Orthogonal Loops; Phase Shifting
Article - Conference proceedings
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