Abstract

Near-field probes are often used to measure the electric and magnetic fields above a printed circuit board in order to identify the sources and coupling paths of an electromagnetic interference (EMI) problem. It is the objective of this paper to propose a rapid E-, Hx- Hy- and circular H-fields measurement using an orthogonal loops probe design. The effects of this probe are analyzed using full-wave simulations and measurements.

Meeting Name

2005 International Symposium on Electromagnetic Compatibility, 2008. EMC 2008

Department(s)

Electrical and Computer Engineering

Keywords and Phrases

Electromagnetic Interference; Orthogonal Loops; Phase Shifting

Document Type

Article - Conference proceedings

Document Version

Final Version

File Type

text

Language(s)

English

Rights

© 2008 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

Full Text Link

Share

 
COinS