Abstract

This paper describes a methodology to extract effective electrical properties for periodic composite medium. The extraction algorithm is based on a periodic finite-difference time-domain (FDTD) method. The results are compared with conventional mixing theories and 3D Fourier series expansion methods. Two results show satisfactory agreement. With the extracted effective permittivity and conductivity, one can readily use these parameters to study electrical properties of composite materials with arbitrary micro-geometry and the shielding effects of using composite materials.

Meeting Name

IEEE International Symposium on Electromagnetic Compatibility (2007: Jul. 9-13, Honolulu, HI)

Department(s)

Electrical and Computer Engineering

Research Center/Lab(s)

Electromagnetic Compatibility (EMC) Laboratory

Keywords and Phrases

FDTD Method; Composite Medium; Electromagnetic Shielding; Finite Difference Time-Domain Analysis; Mixture Theory; Periodic Structures; Shielding; Composite Materials; Fourier Analysis; Composite Micromechanics; Electric Currents; Electric Inverters; Electric Network Analysis; Electric Properties; Electromagnetic Compatibility; Electromagnetism; Extraction; Finite Difference Method; Finite Difference Time Domain Method; Fourier Series; Harmonic Analysis; Magnetic Materials; Materials Properties; Method Of Moments; Mixing; Nonlinear Optics; Plastic Molds; Radiation Protection; Radiation Shielding; Shielding; Technical Presentations; Three Dimensional; Effective Permittivity; Electrical Properties; Extraction Algorithms; Finite-Difference Time-Domain Methods; Fourier-Series Expansion; International Symposium; Micro Geometries; Mixture Theory; Numerical Modelling; Periodic Structures; Shielding Effects

International Standard Book Number (ISBN)

1424413508; 9781424413508

International Standard Serial Number (ISSN)

2158-110X; 2158-1118

Document Type

Article - Conference proceedings

Document Version

Final Version

File Type

text

Language(s)

English

Rights

© 2007 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

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