Doctoral Dissertations

Title

An integrated circuit reliability model and its applicability towards improving programmable logic device reliability

Department(s)

Electrical and Computer Engineering

Degree Name

Ph. D. in Electrical Engineering

Publisher

University of Missouri--Rolla

Publication Date

Spring 1992

Pagination

xiii, 205 pages

Rights

© 1992 James Louis Paunicka, All rights reserved.

Document Type

Dissertation - Citation

File Type

text

Language

English

Thesis Number

T 6411

Print OCLC #

26980960

Link to Catalog Record

Full-text not available: Request this publication directly from Missouri S&T Library or contact your local library.

http://laurel.lso.missouri.edu/record=b2497804~S5

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