An integrated circuit reliability model and its applicability towards improving programmable logic device reliability
Electrical and Computer Engineering
Ph. D. in Electrical Engineering
University of Missouri--Rolla
xiii, 205 pages
© 1992 James Louis Paunicka, All rights reserved.
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Full-text not available: Request this publication directly from Missouri S&T Library or contact your local library.http://laurel.lso.missouri.edu/record=b2497804~S5
Paunicka, James Louis, "An integrated circuit reliability model and its applicability towards improving programmable logic device reliability" (1992). Doctoral Dissertations. 885.