"The exposure of electronic circuits to lightning, electrostatic discharge (ESD), electrical fast transients (EFT) or sine wave signals can reveal RF immunity problems. Typical problems include temporary malfunctions or permanent damage of integrated circuits (ICs). In an effort to reproduce those disturbances, a series of electromagnetic compatibility standards has been developed. However, a complete understanding of the root cause of the immunity problems has yet to be established. This dissertation discusses immunity problems in three papers, starting at the system level, via the coupling path into the IC"--Abstract, page iv.
Beetner, Daryl G.
DuBroff, Richard E.
Drewniak, James L.
Electrical and Computer Engineering
Ph. D. in Electrical Engineering
Missouri University of Science and Technology
Journal article titles appearing in thesis/dissertation
- Correlation between EUT failure levels and ESD generator parameters
- Frequency domain measurement method for the analysis of ESD generators and coupling
- Non-linear [Greek character for mu]-controller power distribution network model for characterization of immunity to EFTS
xiii, 102 pages
© 2008 Ja Yong Koo, All rights reserved.
Dissertation - Open Access
Library of Congress Subject Headings
Electric power system stability
Electromagnetic compatibility -- Standards
Print OCLC #
Electronic OCLC #
Link to Catalog Recordhttp://laurel.lso.missouri.edu/record=b6838905~S5
Koo, Jayong, "System and IC level analysis of electrostatic discharge (ESD) and electrical fast transient (EFT) immunity and associated coupling mechanisms" (2008). Doctoral Dissertations. 2287.