Doctoral Dissertations

Author

Weifeng Pan

Abstract

"A variety of methods exist that help locate the source, coupling path, and antenna in an electromagnetic interference (EMI) problem. No single method is the best option in all cases. A good electromagnetic compatibility (EMC) engineer should understand and have experience with a wide range of failure analysis methods and thus, be able to select the most appropriate ones for a given problem. The first three papers are from a series of articles, which explains a set of methods for the analysis of EMI failures. Each method is categorized based on two criteria: 1) the elements in an EMI problem each method tries to determine: the source, coupling path or the antenna; 2) the complexity of each method. The methods are explained to guide EMC engineers in selecting the right one by evaluating the advantages and limitations of each method. Printed circuit boards (PCBs) often have high speed data traces crossing splits in the adjacent reference planes due to space limitations and cost constraints. These split planes usually result from different power islands on nearby layers. The fourth paper quantifies the effects of the split planes and the associated stitching capacitors for various stack-up configurations"--Abstract, page iv.

Advisor(s)

Pommerenke, David

Committee Member(s)

Beetner, Daryl G.
DuBroff, Richard E.
OKeefe, Matt
Drewniak, James L.

Department(s)

Electrical and Computer Engineering

Degree Name

Ph. D. in Electrical Engineering

Publisher

Missouri University of Science and Technology

Publication Date

Summer 2009

Journal article titles appearing in thesis/dissertation

  • EMI failure analysis techniques: I. Frequency spectrum analysis
  • EMI failure analysis: II. Joint time-frequency analysis
  • EMI failure analysis techniques: III. Correlation analysis
  • Predicting noise voltage from trace crossing split planes on printed circuit boards

Pagination

x, 57 pages

Note about bibliography

Includes bibliographical references.

Rights

© 2009 Weifeng Pan, All rights reserved.

Document Type

Dissertation - Open Access

File Type

text

Language

English

Library of Congress Subject Headings

Electromagnetic compatibility
Electromagnetic interference
Fourier analysis -- Data processing

Thesis Number

T 9529

Print OCLC #

503472147

Electronic OCLC #

352926579

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