Doctoral Dissertations

Title

Near-field measurement and analysis procedures for characterizing electromagnetic interference

Alternative Title

Near field measurement and analysis procedures for characterizing electromagnetic interference

Author

Jin Shi

Abstract

"This dissertation discusses and studies the near-field scanning technique and its application in characterizing electromagnetic interference"--Abstract, leaf iv.

Department(s)

Electrical and Computer Engineering

Degree Name

Ph. D. in Electrical Engineering

Publisher

University of Missouri--Rolla

Publication Date

Spring 2005

Journal article titles appearing in thesis/dissertation

  • Introduction ton near-field scanning
  • Study of the probe induced disturbances on the near-field measurement
  • Calibration and compensation of near-field scan measurements
  • Radiated EMI prediction from planar near-field scanning utilizing an equivalent electric current and full wave simulation

Pagination

xi, 78 leaves

Note about bibliography

Includes bibliographical references.

Rights

© 2005 Jin Shi, All rights reserved.

Document Type

Dissertation - Citation

File Type

text

Language

English

Library of Congress Subject Headings

Near-fields -- Measurement
Electromagnetic interference
Calibration

Thesis Number

T 8734

Print OCLC #

63906187

Link to Catalog Record

Full-text not available: Request this publication directly from Missouri S&T Library or contact your local library.

http://laurel.lso.missouri.edu/record=b5484320~S5

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