Near-field measurement and analysis procedures for characterizing electromagnetic interference
Near field measurement and analysis procedures for characterizing electromagnetic interference
"This dissertation discusses and studies the near-field scanning technique and its application in characterizing electromagnetic interference"--Abstract, leaf iv.
Electrical and Computer Engineering
Ph. D. in Electrical Engineering
University of Missouri--Rolla
Journal article titles appearing in thesis/dissertation
- Introduction ton near-field scanning
- Study of the probe induced disturbances on the near-field measurement
- Calibration and compensation of near-field scan measurements
- Radiated EMI prediction from planar near-field scanning utilizing an equivalent electric current and full wave simulation
xi, 78 leaves
© 2005 Jin Shi, All rights reserved.
Dissertation - Citation
Library of Congress Subject Headings
Near-fields -- Measurement
Print OCLC #
Link to Catalog Record
Full-text not available: Request this publication directly from Missouri S&T Library or contact your local library.http://laurel.lso.missouri.edu/record=b5484320~S5
Shi, Jin, "Near-field measurement and analysis procedures for characterizing electromagnetic interference" (2005). Doctoral Dissertations. 1602.