VLSI layout verification using adaptive critic designs and fuzzy logic

Author

Nian Zhang

Keywords and Phrases

Adaptive critic design

Abstract

"In this dissertation, the heuristic dynamic programming and fuzzy logic approaches for VLSI layout verification were proposed, and compared to existing commercial software and published approaches"--Abstract page iv.

Department(s)

Electrical and Computer Engineering

Degree Name

Ph. D. in Computer Engineering

Publisher

University of Missouri--Rolla

Publication Date

Summer 2004

Journal article titles appearing in thesis/dissertation

• Subcircuit extraction problem
• VLSI layout verification using adaptive critic designs
• Subcircuit extraction using fuzzy attributed graph

Pagination

xi, 80 pages

Note about bibliography

Includes bibliographical references.

Rights

© 2004 Nian Zhang, All rights reserved.

Document Type

Dissertation - Citation

File Type

text

Language

English

Subject Headings

Integrated circuits -- Very large scale integration
Dynamic programming
Neural networks (Computer science)
Fuzzy logic

Thesis Number

T 8554

Print OCLC #

62138318

Link to Catalog Record

Full-text not available: Request this publication directly from Missouri S&T Library or contact your local library.

Recommended Citation

Zhang, Nian, "VLSI layout verification using adaptive critic designs and fuzzy logic" (2004). Doctoral Dissertations. 1574.
https://scholarsmine.mst.edu/doctoral_dissertations/1574