Title

VLSI Self-Testing Based on Syndrome Techniques

Meeting Name

International Test Conference (1981: Oct., Philadelphia, PA)

Department(s)

Computer Science

Keywords and Phrases

Architecture; IC Testing; LSI; Macros; Self-testing; Syndrome Techniques; VLSI; Weighted Syndromes; Integrated Circuits

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 1981 International Test Conference, All rights reserved.


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