VLSI Self-Testing Based on Syndrome Techniques
Z. Barzilai et al., "VLSI Self-Testing Based on Syndrome Techniques," Proceedings of the International Test Conference (1981, Philadelphia, PA), pp. 102-109, International Test Conference, Oct 1981.
International Test Conference (1981: Oct., Philadelphia, PA)
Keywords and Phrases
Architecture; IC Testing; LSI; Macros; Self-testing; Syndrome Techniques; VLSI; Weighted Syndromes; Integrated Circuits
Article - Conference proceedings
© 1981 International Test Conference, All rights reserved.