Statistical Analysis of Backscattered Electron Image of Hydrated Cement Paste

Abstract

Backscattered electron (BSE) imaging has been widely used to investigate the microstructure of cement-based materials, and it has shown specific advantages in determining the fractions and distribution of individual phases. The lower and upper grey level thresholds for the investigated phases need to be determined as the key references for BSE image analysis. However, the traditional determination of the grey level thresholds for phases is quite arbitrary. A novel method is proposed to analyse BSE images of cement-based materials using statistical analysis, avoiding the subjective choice of grey level thresholds.

Department(s)

Civil, Architectural and Environmental Engineering

Keywords and Phrases

Backscattering; Cements; Electron Microscopy; Electron Scattering; Microstructure; Statistical Methods; Backscattered Electron Images; Backscattered Electron Imaging; Cement Based Material; Concrete Components; Grey Levels; Hydrated Cement Pastes; Image Analysis

International Standard Serial Number (ISSN)

0951-7197

Document Type

Article - Journal

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2016 Thomas Telford Services Ltd, All rights reserved.

Publication Date

01 Jul 2016

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