Title

Imaging Ultrathin Al₂O₃ Films with Scanning Tunneling Microscopy

Abstract

Reproducible scanning tunneling microscopic (STM) images were obtained from ultrathin Al2O3 films epitaxially grown on Re(0001). Initially, the oxide films grow two-dimensionally in a layer-by-layer fashion with well-ordered surface morphologies. As the oxide film thickens to ca. 9 monolayer equivalents (MLE), the surface roughens and becomes more disordered yet still exhibits significant long-range, hexagonal periodicity as indicated by low energy electron diffraction (LEED). Because of limited conductivity, films thicker than ca. 9 MLE could not be imaged. © 2000 Elsevier Science B.V.

Department(s)

Chemistry

Document Type

Article - Journal

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2000 Elsevier, All rights reserved.


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