Title

Scanning Tunneling Microscopy of Nanoscale Electrodeposited Superlattices

Abstract

Artificially layered superconductor materials based on crystalline multilayer structure are of potential interest due to the unusual quantum effects which could be expected in materials of this type. Scanning tunneling microscopy has recently been used (e.g. see Figure) to measure the modulation wavelength (the bilayer thickness) and to estimate the composition profile in such superlattices.

Department(s)

Chemistry

Document Type

Article - Journal

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 1993 Wiley-VCH Verlag, All rights reserved.


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