Real-time Studies of the Electrocrystallization of Nanoscale Ceramic Superlattices
Electrodeposition is unique among thin film deposition techniques, since the current following a potential step from open circuit to a given overpotential (i.e., driving force) provides a real-time, in situ probe of the deposition process. We have used current-time transients to determine the kinetics and dimensionality of growth, and to calculate the composition profiles of electrodeposited superlattices in the Pb-Tl-O system. The transients are indicative of 2D growth, and the height of the 2D monolayer depends on the orientation of the film. A  oriented film has a step height of 0.13 nm and a  oriented film has a step height of 0.18 nm. These heights correspond to the (400) and (220) d-spacings, respectively. Using a Cottrell analysis, we were able to both calculate and tailor the composition profile in these superlattices. Superlattices grown by pulsing between 70 and 150 mV have square profiles, while those grown by pulsing between 70 and 230 mV have graded profiles.
T. D. Golden et al., "Real-time Studies of the Electrocrystallization of Nanoscale Ceramic Superlattices," Materials Research Society Symposium - Proceedings, Materials Research Society, Jan 1995.
Materials Research Society Symposium Proceedings (1995, San Francisco, CA, USA)
Article - Conference proceedings
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