Title

Reentrant High-conduction State in CuIr2S4 under Pressure

Abstract

The results of electrical resistance and angle dispersive X-ray diffraction measurements at high pressures and ambient temperature on the chalcogenide spinel, CuIr2S4 are reported. The resistance increases gradually and reaches around 12 GPa a value that is approximately forty times the initial value. Above 15 GPa, the resistance decreases up to 30 GPa and on further pressure increase tends to saturate at a value slightly above the ambient pressure value. Thus, the material exhibits a reentrant high conducting phase under pressure. The behaviour of the electrical resistance exhibits a close correlation with the structural evolution with pressure.

Department(s)

Chemistry

Keywords and Phrases

Conduction Bands; Correlation Methods; Electric Resistance; Pressure Effects; X Ray Diffraction Analysis; Angle Dispersive X-ray Diffraction Measurements; Chalcogenide Spinel; Conducting Phase; Copper Compounds; A. Inorganic Compounds; B. X-ray Diffraction; C. Electric Transport; D. High Pressure

International Standard Serial Number (ISSN)

0038-1098

Document Type

Article - Journal

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2007 Elsevier, All rights reserved.

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