Finding Noise-related Artifacts in Scanned-probe Microscope Images
Structures not of the actual specimen may appear in scanned probe microscopic images. These may arise from time domain instabilities of the microscope. Presented in this article are the artifacts independent of tip shape and existing in the slow scan limit, and the way in which low pass filtering can give the artifacts 3D character. Tests using Fourier phases and amplitudes in scanned probe images are conducted to detect the presence of the artifacts.
H. Siriwardane et al., "Finding Noise-related Artifacts in Scanned-probe Microscope Images," Proceedings - Annual Meeting, Microscopy Society of America, Microscopy Society of America, Jan 1993.
Proceedings - Annual Meeting, Microscopy Society of America (1993, Cincinnati, OH, USA)
Article - Conference proceedings
© 1993 Microscopy Society of America, All rights reserved.
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